Dynamic41 100eng

dynamic41|100

detector for 2D inspection and HR CT

  • 16” X-ray detector with 100 μm pixelsize (16 MPixels) designed and optimized for longterm reliability at industrial high-energy use
  • Next generation photodiode design for up to 10x improved efficiency and sensitivity compared to other detectors
  • Detection of 2x smaller defects without increase of geometric magnification allows imaging of large objects at higher resolution

dynamic 41|100 - Superior Image Quality X-Ray Detector

The dynamic 41|100 is the first product in GE’s next generation industrial X-ray flat panel X-ray detector platform. At 410 x 410 mm2 detection area and 100 µm pixel size, it combines superior image quality with improved detection speed.

Based on proprietary GE Healthcare X-ray detector technology, GE Inspection Technologies exclusively offers its first 100 µm, 16M pixel detector designed and optimized exclusively for rough and high-energy industrial X-ray applications to its radiography and CT customers. GE’s proprietary EnduranceTM CSI scintillator offers superior resolution and brightness compared to conventional GadOx or other powder based scintillators.

Doubled productivity at same quality level

Due to its equivalent or even higher sensitivity compared to state of the art 200 μm pixelsize detectors, the new dynamic 41|100 detector allows a 2x resolution increase without cycle time impact or comparable result quality at significant reduced acquisition time. The comparison below shows pores in a scanned aluminum casting.

Doubled resolution

Without the need to change the system geometry parameters, the new dynamic 41|100 detector allows imaging of larger objects at the same resolution due to less required geometric magnification. Alternatively, users are able to detect 2x smaller defects without increasing the geometric magnification

Features and Benefits

  • Large area 16” X-ray detector with 100 µm pixelsize (16 MPixels) for superior image and result quality designed and optimized for longterm reliability at industrial high-energy use
  • High-resolution images for easy detection of subtle indications (up to 50 µm feature detection with minifocus X-ray tubes)
  • Next generation photodiode design for up to 10x improved efficiency and sensitivity compared to state of the art 200 µm pixel detectors allows 2x resolution increase without cycle time impact
  • Detection of 2x smaller defects without increase of geometric magnification allows imaging of large objects at higher resolution
  • Reduce inspection times due to increased detector sensitivity, faster frame rates, larger imaging area and adaptive imaging modes
  • GE’s proprietary dynamic 41 detector family is exclusively available for GE Inspection Technologies system customers

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