detector for 2D inspection and HR CT
The dynamic 41|100 is the first product in GE’s next generation industrial X-ray flat panel X-ray detector platform. At 410 x 410 mm2 detection area and 100 µm pixel size, it combines superior image quality with improved detection speed.
Based on proprietary GE Healthcare X-ray detector technology, GE Inspection Technologies exclusively offers its first 100 µm, 16M pixel detector designed and optimized exclusively for rough and high-energy industrial X-ray applications to its radiography and CT customers. GE’s proprietary EnduranceTM CSI scintillator offers superior resolution and brightness compared to conventional GadOx or other powder based scintillators.
Due to its equivalent or even higher sensitivity compared to state of the art 200 μm pixelsize detectors, the new dynamic 41|100 detector allows a 2x resolution increase without cycle time impact or comparable result quality at significant reduced acquisition time. The comparison below shows pores in a scanned aluminum casting.
Without the need to change the system geometry parameters, the new dynamic 41|100 detector allows imaging of larger objects at the same resolution due to less required geometric magnification. Alternatively, users are able to detect 2x smaller defects without increasing the geometric magnification
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