Metrology Tomography

DYNAMIC 41 | 100

DYNAMIC 41 | 100

Baker Hughes GE

The dynamic 41|100 is the first product in GE’s next generation industrial X-ray flat panel X-ray detector platform. At 410 x 410 mm2 detection area and 100 µm pixel size, it combines superior image quality with improved detection speed.
vai alla pagina

NANOTOM M

NANOTOM M

Baker Hughes GE

The phoenix nanotom® m is a nanoCT® system for scientific and industrial computed tomography (microCT and nanoCT) and 3D metrology.
vai alla pagina

SCATTER | CORRECT

SCATTER | CORRECT

Baker Hughes GE

Scattering of X-rays is the main factor for such artefacts in CT. While state of the art scatter reduction simulates scatter based on CAD data or sample’s material properties, GE's proprietary scatter|correct technology is really measuring the s...
vai alla pagina

V|TOME|X C 450

V|TOME|X C 450

Baker Hughes GE

It is the first industrial CT scanner with GE’s proprietary breakthrough scatter|correct technology option allowing users to gain a low scatter artifact CT quality level never before reached with conventional industrial flat panel cone beam CT. ...
vai alla pagina

V|TOME|X M 300KV/500W

V|TOME|X M 300KV/500W

Baker Hughes GE

The phoenix v|tome|x m is a versatile X-ray microfocus CT system for 3D metrology and analysis with up to 300 kV / 500 W. For the first time, GE’s unique X-ray tube is available in a compact CT system for industrial process control as well as fo...
vai alla pagina

Any question?

We answer your technical or commercial questions.

Contact us now

Instrument broken?

You can also contact us for repairing your instruments.
Request a quote

share by:

Do you need assistance?
We are ready for you!

We answer your technical or commercial questions, contact us also by email or phone. We organize demos for the instruments of your interest, as well as support you with specialized training.

Contact us now