Metrology Tomography
Inline CT Solutions
Waygate Technologies PhoenixAutomotive manufacturers must consistently produce high quality parts and products, while operating high-speed production lines. High resolution, high speed, full 3D inspection via in-line automation is required to ensure both safety and profitabi...
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NANOTOM M
Waygate Technologies PhoenixThe phoenix nanotom® m is a nanoCT® system for scientific and industrial computed tomography (microCT and nanoCT) and 3D metrology.
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SCATTER | CORRECT
Waygate Technologies PhoenixScattering of X-rays is the main factor for such artefacts in CT. While state of the art scatter reduction simulates scatter based on CAD data or sample’s material properties, GE's proprietary scatter|correct technology is really measuring the s...
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V|TOME|X M 300KV/500W
Waygate Technologies PhoenixThe phoenix v|tome|x m is a versatile X-ray microfocus CT system for 3D metrology and analysis with up to 300 kV / 500 W. For the first time, GE’s unique X-ray tube is available in a compact CT system for industrial process control as well as fo...
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V|TOME|X C 450
Waygate Technologies PhoenixIt is the first industrial CT scanner with Waygate proprietary breakthrough scatter|correct technology option allowing users to gain a low scatter artifact CT quality level never before reached with conventional industrial flat panel cone beam CT.
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DYNAMIC 41 | 100
Waygate Technologies PhoenixThe dynamic 41|100 is the first product in GE’s next generation industrial X-ray flat panel X-ray detector platform. At 410 x 410 mm2 detection area and 100 µm pixel size, it combines superior image quality with improved detection speed.
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