X-ray microfocus CT per metrologia 3D
The phoenix v|tome|x m is a versatile X-ray microfocus CT system for 3D metrology and analysis with up to 300 kV / 500 W. For the first time, GE’s unique X-ray tube is available in a compact CT system for industrial process control as well as for scientific research applications. Beyond down to < 1 µm detail detectability, the system offers industry leading magnification and power at 300 kV. GE’s dynamic 41 digital detector array, the click & measure|CT automatization functionality as well as its optional collaborative robot make its production edition an efficient 3D inspection tool. The v|tome|x m is the first industrial mircoCT scanner with GE's breakthrough scatter|correct technology. This technological advancement automatically removes scatter artifacts from CT volume, allowing users to gain significant improved CT results compared to conventional cone beam microCT. Addtionally, it can be equipped with GE'sproprietary high-flux|target for up to 2 times faster microCT scans or doubled resolution.
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